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TÍTULO: Swept Notch NPR for Linearity Assessment of Systems Presenting Long-Term Memory Effects
AUTORES: Figueiredo, R; Piacibello, A; Camarchia, V; Carvalho, NB;
PUBLICAÇÃO: 2020, FONTE: 95th ARFTG Microwave Measurement Conference (ARFTG) in 2020 95TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG): MICROWAVE AND MILLIMETER-WAVE MEASUREMENTS FOR THE CONNECTED WORLD
INDEXADO EM: WOS