31
TÍTULO: MOSYS: A methodology for automatic object identification from system specification
AUTORES: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
INDEXADO EM: Scopus CrossRef
32
TÍTULO: Testability issues in the CMS ECAL upper-level readout and trigger system
AUTORES: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLICAÇÃO: 1999, FONTE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
INDEXADO EM: WOS
33
TÍTULO: From continuing education to continuing learning using self assessment and process monitoring
AUTORES: Teixeira, IC; Teixeira, JP; Pile, M; Durao, D;
PUBLICAÇÃO: 1998, FONTE: 7th World Conference on Continuing Engineering Education: the Knowledge Revolution - the Impact of New Technologies o n Learning in KNOWLEDGE REVOLUTION, THE IMPACT OF TECHNOLOGY ON LEARNING, PROCEEDINGS
INDEXADO EM: WOS
34
TÍTULO: Trends on microelectronic systems education
AUTORES: Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 1998, FONTE: 2nd European Workshop on Microelectronics Education in MICROELECTRONICS EDUCATION
INDEXADO EM: WOS
35
TÍTULO: A strategy for testability enhancement at layout level
AUTORES: Teixeira, JP; Teixeira, IC; Almeida, CFB; Goncalves, FM; Goncalves, J; Crespo, R;
PUBLICAÇÃO: 1990, FONTE: 1990 European Design Automation Conference, EDAC 1990 in Proceedings of the European Design Automation Conference, EDAC 1990
INDEXADO EM: Scopus
Página 4 de 4. Total de resultados: 35.