Ion Beam Induced Current Analysis in Gan Microwires

AuthID
P-012-5CS
9
Author(s)
Verheij, D
·
Peres, M
·
Cardoso, S
·
Alves, LC
·
Durand, C
·
Eymery, J
·
Fernandes, J
·
2
Editor(es)
Almeida,B;Agostinho Moreira,J
Tipo de Documento
Article
Year published
2020
Publicado
in EPJ Web of Conferences
Volume: 233, Páginas: 05001
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