Thin-Film Field-Effect Transistors: The Effects of Traps on the Bias and Temperature Dependence of Field-Effect Mobility, Including the Meyer-Neldel Rule

AuthID
 P-004-FXJ
2
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Tipo de Documento
Article
Year published
2006
Publicado
in ORGANIC ELECTRONICS, ISSN: 1566-1199
Volume: 7, Número: 6, Páginas: 592-599 (8)
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Publication Identifiers
SCOPUS: 2-s2.0-33751018886
Wos: WOS:000242736700021
Source Identifiers
ISSN: 1566-1199
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