The Effect of Water Related Traps on the Reliability of Organic Based Transistors

AuthID
 P-004-K6V
5
Author(s)
Colle, M
·
Biscarini, F
·
de Leeuw, DM
Tipo de Documento
Article
Year published
2006
Publicado
in JOURNAL OF NON-CRYSTALLINE SOLIDS, ISSN: 0022-3093
Volume: 352, Número: 9-20, Páginas: 1761-1764 (4)
Conference
21St International Conference on Amorphous and Nanocrystalline Semiconductors, Date: SEP 04-09, 2005, Location: Lisbon, PORTUGAL
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Publication Identifiers
SCOPUS: 2-s2.0-33744548872
Wos: WOS:000238782900215
Source Identifiers
ISSN: 0022-3093
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