Dft and Probabilistic Testability Analysis at Rtl

AuthID
P-004-PSX
4
Author(s)
Fernandes, JM
·
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in HLDVT'06: ELEVENTH ANNUAL IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGS in IEEE International High Level Design Validation and Test Workshop, ISSN: 1552-6674
Páginas: 41-47 (7)
Conference
11Th Annual Ieee International Workshop on High Level Design Validation and Test, Date: NOV 08-10, 2006, Location: Monterey, CA, Patrocinadores: IEEE Comp Soc, TTTC, IEEE Comp Soc, DATC
Indexing
Publication Identifiers
DBLP: conf/hldvt/FernandesSOT06
SCOPUS: 2-s2.0-46249127278
Wos: WOS:000243258900007
Source Identifiers
ISSN: 1552-6674
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