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Functional-Oriented Bist of Sequential Circuits Aiming at Dynamic Faults Coverage

AuthID
P-004-QJM

Author(s)

Guerreiro, F

Pierce, A

Tipo de Documento

Proceedings Paper

Year published

2006

Publicado

in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

Volume: 2006, Páginas: 279-284 (6)

Conference

9Th Ieee Workshop on Design and Diagnostics of Electronic Circuits and Systems, Date: APR 18-21, 2006, Location: Prague, CZECH REPUBLIC, Patrocinadores: IEEE Comp Soc, TTTC, Czech Tech Univ

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Publication Identifiers

DOI: 10.1109/ddecs.2006.1649635

SCOPUS: 2-s2.0-33847120256

Wos: WOS:000238973400077

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Functional-Oriented Bist of Sequential Circuits Aiming at Dynamic Faults Coverage

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