Architecture of Test Support Ics for Mixed-Signal Testing

AuthID
 P-007-6DK
4
Author(s)
Matos Jose, S
·
Leao Ana, C
·
1
Editor(es)
Anon
Tipo de Documento
Proceedings Paper
Year published
1994
Publicado
in Proceedings of the IEEE VLSI Test Symposium
Páginas: 240-246
Conference
Proceedings of the 12Th Ieee Vlsi Test Symposium, Date: 25 April 1994 through 28 April 1994, Location: Cherry Hill, NJ, USA, Patrocinadores: IEEE Computer Society;IEEE Philadelphia Section
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0028734870
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