Extended X-Ray Absorption Fine Structure Studies of Thulium Doped Gan Epilayers

AuthID
P-007-C1M
12
Author(s)
Katchkanov, V
·
Mosselmans, JFW
·
Dalmasso, S
·
O'Donnell, KP
·
Hernandez, S
·
Wang, K
·
Martin, RW
·
Briot, O
·
Rousseau, N
·
Halambalakis, G
·
1
Editor(es)
Briot O.Butcher K.S.Gil B.Wetzel C.Yoshikawa A.
Tipo de Documento
Article
Year published
2004
Publicado
in Superlattices and Microstructures, ISSN: 0749-6036
Volume: 36, Número: 4-6, Páginas: 729-736
Conference
European Materials Research Society 2004, Symposium L. Inn, Date: 24 May 2004 through 28 May 2004, Location: Strasbourg
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-10044293362
Source Identifiers
ISSN: 0749-6036
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