Rtl Level Preparation of High-Quality/Low-Energy/Low-Power Bist

AuthID
 P-000-RCR
6
Author(s)
Manich, S
·
Rodriguez, R
·
Figueras, J
Tipo de Documento
Proceedings Paper
Year published
2002
Publicado
in INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS in INTERNATIONAL TEST CONFERENCE, PROCEEDINGS, ISSN: 1089-3539
Páginas: 814-823 (10)
Conference
International Test Conference, Date: OCT 07-10, 2002, Location: BALTIMORE, MD, Patrocinadores: IEEE Comp, Test Technol Tech Council, IEEE Philadelphia Sect
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0036443196
Wos: WOS:000180001500100
Source Identifiers
ISSN: 1089-3539
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