in Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010
Páginas: 72-77
Conference
13Th Ieee International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Ddecs 2010, Date: 14 April 2010 through 16 April 2010, Location: Vienna, Patrocinadores: IEEE Computer Society;Test Technology Technical Council;RUAG Space GmbH;City of Vienna