Publicações

Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling

AuthID
P-000-S7T

Author(s)

Goncalves, FM

Santos, MB

Teixeira, IC

Teixeira, JP

Tipo de Documento

Proceedings Paper

Year published

2002

Publicado

in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS in IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - PROCEEDINGS, ISSN: 1063-6722

Volume: 2002-January, Páginas: 216-224 (9)

Conference

17Th Ieee International Symposium on Defect and Fault Tolerance in Vlsi Systems, Date: NOV 06-08, 2002, Location: VANCOUVER, CANADA, Patrocinadores: IEEE Comp Soc, Test Tech Council, IEEE Comp Soc, Tech Comm Fault Tolerant Comp

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