On-Line Bist for Performance Failure Prediction Under Nbti-Induced Aging in Safety-Critical Applications

AuthID
 P-008-2MR
5
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in Journal of Low Power Electronics, ISSN: 1546-1998
Volume: 7, Número: 4, Páginas: 562-572
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Publication Identifiers
SCOPUS: 2-s2.0-84857267074
Source Identifiers
ISSN: 1546-1998
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