Publicações

Entropy-Based Test Generation for Improved Fault Localization

AuthID
P-008-YED

Author(s)

Campos, J

Abreu, R

Fraser, G

d'Amorim, M

Editor(es)

Ewen Denney; Tevfik Bultan; Andreas Zeller

Tipo de Documento

Proceedings Paper

Year published

2013

Publicado

in 2013 28TH IEEE/ACM INTERNATIONAL CONFERENCE ON AUTOMATED SOFTWARE ENGINEERING (ASE) in IEEE ACM International Conference on Automated Software Engineering, ISSN: 1527-1366

Páginas: 257-267 (11)

Conference

28Th Ieee/Acm International Conference on Automated Software Engineering (Ase), Date: NOV 11-15, 2013, Location: Palo Alto, CA, Patrocinadores: IEEE, Assoc Comp Machinery, IEEE Comp Soc, Tech Council Software Engn, Special Interest Grp Software Engn, Assoc Comp Machinery, SIGART, NASA, Stinger Ghaffarian Technologies, Google, Microsoft, D Risq Software Syst

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