Rtl Design Validation, Dft and Test Pattern Generation for High Defects Coverage

AuthID
 P-000-X2N
4
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2001
Publicado
in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
Páginas: 99-105 (7)
Conference
Ieee European Test Workshop (Etw 01), Date: MAY 29-JUN 01, 2001, Location: STOCKHOLM, SWEDEN, Patrocinadores: IEEE Comp Soc Test Technol Council, Linkoping Univ, Ericsson, Philips, Mentor Graph
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Wos: WOS:000172784500013
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