Metrics and Criteria for Quality Assessment of Testable Hw Sw Systems Architectures

AuthID
 P-001-56J
3
Author(s)
Tipo de Documento
Article
Year published
1999
Publicado
in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 14, Número: 1-2, Páginas: 149-158 (10)
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Publication Identifiers
SCOPUS: 2-s2.0-0032690975
Wos: WOS:000080732400018
Source Identifiers
ISSN: 0923-8174
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