in INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS in INTERNATIONAL TEST CONFERENCE, PROCEEDINGS, ISSN: 1089-3539
Páginas: 35-42 (8)
Conference
International Test Conference 1998, Date: OCT 18-23, 1998, Location: WASHINGTON, D.C., Patrocinadores: IEEE Comp Soc, Test Technol Tech Comm, IEEE Philadelphia Sect
