An Exact Solution to the Minimum Size Test Pattern Problem

AuthID
P-001-A1S
3
Author(s)
Tipo de Documento
Proceedings Paper
Year published
1998
Publicado
in INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS in ICCD
Páginas: 510-515 (6)
Conference
International Conference on Computer Design: Vlsi in Computers and Processors, Date: OCT 05-07, 1998, Location: AUSTIN, TX, Patrocinadores: IEEE, Comp Soc, IEEE, Circuits & Syst Soc, IEEE, Electron Devices Soc
Indexing
Publication Identifiers
DBLP: conf/iccd/FloresNS98
SCOPUS: 2-s2.0-0032302181
Wos: WOS:000076796900078
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