Test Preparation for High Coverage of Physical Defects in Cmos Digital Ics

AuthID
 P-00F-GPZ
4
Author(s)
Simoes, M
·
Tipo de Documento
Proceedings Paper
Year published
1995
Publicado
in Proceedings of the IEEE VLSI Test Symposium
Páginas: 330-335
Conference
Proceedings of the 13Th Ieee Vlsi Test Symposium, Date: 30 April 1995 through 3 May 1995, Location: Princeton, NJ, USA, Patrocinadores: IEEE
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0029214664
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