Nonuniversality Due to Inhomogeneous Stress in Semiconductor Surface Nanopatterning by Low-Energy Ion-Beam Irradiation

AuthID
 P-00G-A2N
9
Author(s)
Moreno Barrado, A
·
Gago, R
·
Vazquez, L
·
Munoz Garcia, J
·
Galiana, B
·
Ballesteros, C
·
Cuerno, R
Tipo de Documento
Article
Year published
2015
Publicado
in PHYSICAL REVIEW B, ISSN: 1098-0121
Volume: 91, Número: 15
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Wos®
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Publication Identifiers
Wos: WOS:000352685100004
Source Identifiers
ISSN: 1098-0121
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