Aluminium Incorporation in Alxga1−Xn/Gan Heterostructures: A Comparative Study by Ion Beam Analysis and X-Ray Diffraction

AuthID
P-00H-EGE
7
Author(s)
Gago, R
·
Kreissig, U
·
di Forte Poisson, M
·
Braña, A
·
Muñoz, E
Tipo de Documento
Article
Year published
2008
Publicado
in Thin Solid Films, ISSN: 0040-6090
Volume: 516, Número: 23, Páginas: 8447-8452
Indexing
Publication Identifiers
Source Identifiers
ISSN: 0040-6090
Export Publication Metadata
Info
At this moment we don't have any links to full text documens.