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Identifying the Influence of the Intrinsic Defects in Gd-Doped Zno Thin-Films
AuthID
P-00K-7SK
7
Author(s)
Flemban, TH
·
Sequeira, MC
·
Zhang, Z
·
Venkatesh, S
·
Alves, E
·
Lorenz, K
·
Roqan, IS
Document Type
Article
Year published
2016
Published
in
JOURNAL OF APPLIED PHYSICS,
ISSN: 0021-8979
Volume: 119, Issue: 6, Pages: 065301 (7)
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Publication Identifiers
DOI
:
10.1063/1.4941434
Scopus
: 2-s2.0-84959450178
Wos
: WOS:000370974200030
Source Identifiers
ISSN
: 0021-8979
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