Quantitative X-Ray Diffraction Analysis of Bimodal Damage Distributions in Tm Implanted Al0.15Ga0.85N

AuthID
 P-00K-BYA
5
Author(s)
Fialho, M
·
Tipo de Documento
Article
Year published
2016
Publicado
in Journal of Physics D: Applied Physics, ISSN: 0022-3727
Volume: 49, Número: 13
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Scopus®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84962438835
Source Identifiers
ISSN: 0022-3727
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