Prevalence of Single-Fault Fixes and Its Impact on Fault Localization

AuthID
 P-00M-W6C
3
Author(s)
d'Amorim, M
Tipo de Documento
Proceedings Paper
Year published
2017
Publicado
in 2017 IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, March 13-17, 2017 in ICST
Páginas: 12-22 (10)
Indexing
Scopus®
Dblp®/pt/publications/view/684236
Crossref®17
Google Scholar®
Publication Identifiers
DBLP: conf/icst/PerezAd17
SCOPUS: 2-s2.0-85020718998
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