A Microspectroscopic Study of Cap Damage in Annealed Re-Doped Aln-Capped

AuthID
 P-00P-3JR
9
Author(s)
Nogales, E
·
Wang, K
·
Roqan, IS
·
Martin, RW
·
O'Donnell, KP
·
Alves, E
·
Ruffenach, S
·
Briot, O
4
Editor(es)
Kuball, M; Myers, TH; Redwing, JM; Mukai, T
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in GAN, AIN, INN AND RELATED MATERIALS in Materials Research Society Symposium Proceedings, ISSN: 0272-9172
Volume: 892, Páginas: 625-+ (2)
Conference
Symposium on Gan, Ain, Inn Related Materials Held at the 2005 Mrs Fall Meeting, Date: NOV 28-DEC 02, 2005, Location: Boston, MA
Indexing
Wos®
Publication Identifiers
Wos: WOS:000237224500093
Source Identifiers
ISSN: 0272-9172
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