Impact of the Ferroelectric Layer Thickness on the Resistive Switching Characteristics of Ferroelectric/Dielectric Structures

AuthID
 P-00P-KH3
5
Author(s)
Silva, JMB
·
Silva, JPB
·
Tipo de Documento
Article
Year published
2018
Publicado
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 113, Número: 10
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Publication Identifiers
SCOPUS: 2-s2.0-85052994777
Wos: WOS:000444037000034
Source Identifiers
ISSN: 0003-6951
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