Control and Observation of Analog Nodes in Mixed-Signal Boards

AuthID
 P-00P-S20
3
Author(s)
Leão, AC
·
Tipo de Documento
Proceedings Paper
Year published
1993
Publicado
in Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993
Páginas: 323-331
Indexing
Dblp®/pt/publications/view/746560
Publication Identifiers
DBLP: conf/itc/MatosLF93
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service