Publicações

The Influence of Clock-Gating On Nbti-Induced Delay Degradation

AuthID
P-002-EGP

Author(s)

Pachito, J

Martins, CV

Tipo de Documento

Proceedings Paper

Year published

2012

Publicado

in 2012 IEEE 18TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS) in IEEE International On-Line Testing Symposium, ISSN: 1942-9398

Páginas: 61-66 (6)

Conference

Ieee 18Th International On-Line Testing Symposium (Iolts), Date: JUN 27-29, 2012, Location: Sitges, SPAIN, Patrocinadores: IEEE, IEEE Comp Soc, IEEE Comp Soc Test Technol Tech Council (TTTC), Univ Politecnica Catalunya, Univ Athens, TIMA Lab

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