Characterisation of Negative-U Defects in Semiconductors

AuthID
 P-00S-842
3
Author(s)
Markevich, VP
·
Peaker, AR
Tipo de Documento
Review
Year published
2020
Publicado
in JOURNAL OF PHYSICS-CONDENSED MATTER, ISSN: 0953-8984
Volume: 32, Número: 32, Páginas: 323001 (25)
Indexing
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Scopus®
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Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85088536688
Wos: WOS:000536074800001
Source Identifiers
ISSN: 0953-8984
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