Characterisation of Defects in Rare Earth Implanted Gan by Deep Level Transient Spectroscopy

AuthID
 P-000-8ET
11
Author(s)
Marie, P
·
Eimer, S
·
Mechin, L
·
Matias, V
·
Mamor, M
1
Editor(es)
Briot O.Butcher K.S.Gil B.Wetzel C.Yoshikawa A.
Tipo de Documento
Article
Year published
2004
Publicado
in SUPERLATTICES AND MICROSTRUCTURES, ISSN: 0749-6036
Volume: 36, Número: 4-6, Páginas: 713-719 (7)
Conference
Meeting of the European-Materials-Research-Society, Date: MAY 24-28, 2004, Location: Strasbourg, FRANCE, Patrocinadores: European Mat Res Soc
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Publication Identifiers
SCOPUS: 2-s2.0-10044244023
Wos: WOS:000225762800038
Source Identifiers
ISSN: 0749-6036
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