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Adaptive Error-Prediction Flip-Flop for Performance Failure Prediction with Aging Sensors

AuthID
P-002-WZ8

Author(s)

Martins, CV

Vazquez, JC

Tipo de Documento

Proceedings Paper

Year published

2011

Publicado

in 2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS) in IEEE VLSI Test Symposium, ISSN: 1093-0167

Páginas: 203-208 (6)

Conference

29Th Ieee Vlsi Test Symposium (Vts)/Workshop on Design for Reliability and Variability (Drv), Date: MAY 01-05, 2011, Location: Dana Point, CA, Patrocinadores: IEEE, IEEE Comp Soc, IEEE Comp Soc Test Technol Tech Council

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Publication Identifiers

DOI: 10.1109/vts.2011.5783784

SCOPUS: 2-s2.0-79959649877

Wos: WOS:000300521100038

Source Identifiers

ISSN: 1093-0167

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Adaptive Error-Prediction Flip-Flop for Performance Failure Prediction with Aging Sensors

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