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Teresa Maria Fernandes Rodrigues Cabral Monteiro
AuthID:
R-000-H53
Publications
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Article (141)
Proceedings Paper (12)
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Confirmed Publications: 153
131
TITLE:
Optical doping of nitrides by ion implantation
Full Text
AUTHORS:
Alves, E
;
Lorenz, K
; Vianden, R;
Boemare, C
;
Soares, MJ
;
Monteiro, T
;
PUBLISHED:
2001
,
SOURCE:
Workshop on Advanced Materials Produced and Analyzed with Ion Beams
in
MODERN PHYSICS LETTERS B,
VOLUME:
15,
ISSUE:
28-29
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
132
TITLE:
Photoluminescence and lattice location of Eu and Pr implanted GaN samples
Full Text
AUTHORS:
Monteiro, T
;
Boemare, C
;
Soares, MJ
;
Ferreira, RAS
;
Carlos, LD
;
Lorenz, K
; Vianden, R;
Alves, E
;
PUBLISHED:
2001
,
SOURCE:
21st International Conference on Defects in Semiconductors
in
PHYSICA B-CONDENSED MATTER,
VOLUME:
308
INDEXED IN:
Scopus
WOS
CrossRef
:
78
IN MY:
ORCID
|
ResearcherID
133
TITLE:
Photoluminescence studies in ZnO samples
Full Text
AUTHORS:
Boemare, C
;
Monteiro, T
;
Soares, MJ
;
Guilherme, JG
;
Alves, E
;
PUBLISHED:
2001
,
SOURCE:
21st International Conference on Defects in Semiconductors
in
PHYSICA B-CONDENSED MATTER,
VOLUME:
308
INDEXED IN:
Scopus
WOS
CrossRef
:
65
IN MY:
ORCID
|
ResearcherID
134
TITLE:
A comparative study of n-p GaN/SiC heterojunction and p-n 6H-SiC homojunction diodes
AUTHORS:
Vacas, J;
Lahreche, H
;
Monteiro, T
; Gaspar, C;
Pereira, E
; Brylinski, C; di Forte Poisson, MA;
PUBLISHED:
2000
,
SOURCE:
International Conference on Silicon Carbide and Related Materials
in
SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2,
VOLUME:
338-3
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
135
TITLE:
Effect of crystal orientation on defect production and optical activation of Er-implanted sapphire
Full Text
AUTHORS:
Alves, E
; da Silva, MF;
Soares, JC
;
Monteiro, T
; Soares, J;
Santos, L
;
PUBLISHED:
2000
,
SOURCE:
10th International Conference on Radioation Effects in Insulators (REI-10)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
166
INDEXED IN:
Scopus
WOS
CrossRef
:
13
IN MY:
ORCID
|
ResearcherID
136
TITLE:
Steady-state and time-resolved luminescence in InGaN layers
Full Text
AUTHORS:
Seitz, R; Gaspar, C;
Correia, M
;
Monteiro, T
;
Pereira, E
; Heuken, M;
Schoen, O
;
PUBLISHED:
2000
,
SOURCE:
International Conference on Luminescence and Optical Spectroscopy of Condensed Matter
in
JOURNAL OF LUMINESCENCE,
VOLUME:
87-9
INDEXED IN:
Scopus
WOS
CrossRef
:
1
IN MY:
ORCID
|
ResearcherID
137
TITLE:
Electrical and photoelectronic properties of hexagonal GaN
Full Text
AUTHORS:
Seitz, R; Gaspar, C;
Monteiro, T
;
Pereira, L
;
Pereira, E
; Schon, O; Heuken, M;
PUBLISHED:
1999
,
SOURCE:
3rd International Conference on Nitride Semiconductors (ICNS 99)
in
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
VOLUME:
176,
ISSUE:
1
INDEXED IN:
Scopus
WOS
CrossRef
:
1
IN MY:
ORCID
|
ResearcherID
138
TITLE:
Photoluminescence between 3.36 eV and 3.41 eV from GaN epitaxial layers
AUTHORS:
Seitz, R; Gaspar, C;
Monteiro, T
; Pereira, E; Poisson, MA; Beaumont, B;
PUBLISHED:
1999
,
SOURCE:
Symposium on Wide-Bandgap Semiconductors for High-Power, High-Frequency and High-Temperature Applications-1999 at the 1999 MRS Spring Meeting
in
WIDE-BANDGAP SEMICONDUCTORS FOR HIGH-POWER, HIGH-FREQUENCY AND HIGH-TEMPERATURE APPLICATIONS-1999,
VOLUME:
572
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
139
TITLE:
Strain distribution in GaN hexagons measured by Raman spectroscopy
AUTHORS:
Seitz, R;
Monteiro, T
; Pereira, E; di Forte Poisson, M;
PUBLISHED:
1999
,
SOURCE:
3rd International Conference on Nitride Semiconductors (ICNS 99)
in
PHYSICA STATUS SOLIDI B-BASIC RESEARCH,
VOLUME:
216,
ISSUE:
1
INDEXED IN:
Scopus
WOS
CrossRef
:
1
IN MY:
ORCID
140
TITLE:
Strain relaxation in GaN films as a function of growth direction and buffer layer measured by Raman spectroscopy
Full Text
AUTHORS:
Seitz, R;
Monteiro, T
;
Pereira, E
; Di Forte Poisson, M;
PUBLISHED:
1999
,
SOURCE:
3rd International Conference on Nitride Semiconductors (ICNS 99)
in
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
VOLUME:
176,
ISSUE:
1
INDEXED IN:
WOS
CrossRef
IN MY:
ResearcherID
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