Fernando Manuel Duarte Gonçalves


AuthID: R-000-51G

Confirmed Publications: 34



11
TITLE: Performance simulation studies of the clear-PEM DAQ/trigger system  Full Text
AUTHORS: Pedro Bento; Fernando Goncalves ; Carlos Leong; Pedro Lousa; Joao Nobre; Joel Rego; Paulo Relvas; Pedro Rodrigues; Jose C Silva; Luis Silva; Isabel C Teixeira ; Joao P Teixeira ; Andreia Trindade; Joao Varela ;
PUBLISHED: 2006, SOURCE: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOLUME: 53, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
12
TITLE: The Clear-PEM electronics system  Full Text
AUTHORS: Edgar Albuquerque; Pedro Bento; Carlos Leong; Fernando Goncalves ; Joao Nobre; Joel Rego; Paulo Relvas; Pedro Lousa; Pedro Rodrigues; Isabel C Teixeira ; Joao P Teixeira ; Luis Silva; Medeiros M Silva ; Andreia Trindade; Joao Varela ;
PUBLISHED: 2006, SOURCE: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOLUME: 53, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
13
TITLE: Performance simulation studies of the clear-PEM DAQ/trigger system
AUTHORS: Rodrigues, P; Bento, P; Goncalves, F ; Leong, C; Lousa, P; Nobre, J; Silva, JC; Silva, L; Rego, J; Relvas, P; Teixeira, IC ; Teixeira, JP ; Trindade, A; Varela, J ;
PUBLISHED: 2005, SOURCE: 2005 14TH IEEE-NPSS Real Time Conference in 2005 14TH IEEE-NPSS Real Time Conference, VOLUME: 2005
INDEXED IN: Scopus CrossRef
IN MY: ORCID
14
TITLE: Architecture and first prototype tests of the clear-PEM electronics systems
AUTHORS: Bento, P; Leong, C; Goncalves, F ; Teixeira, IC ; Teixeira, JP ; Nobre, J; Relvas, P; Silva, L; Rodrigues, P; Trindade, A; Varela, J ;
PUBLISHED: 2004, SOURCE: Nuclear Science Symposium/Medical Imaging Conference in 2004 IEEE Nuclear Science Symposium Conference Record, Vols 1-7, VOLUME: 6
INDEXED IN: Scopus WOS
IN MY: ORCID
15
TITLE: Design and evaluation of the clear-PEM detector for positron emission mammography
AUTHORS: Santos, AI; Almeida, P ; Martins, MV ; Matela, N ; Oliveira, N; Ferreira, NC; Aguiar, JD; Almeida, FG ; Lopes, F; Sampaio, J; Bento, P; Goncalves, F ; Leong, C; Lousa, P; Silva, L; Teixeira, IC ; Teixeira, JP ; Abreu, MC ; Carrico, B; Mendes, PR; Pereira, R; Sousa, P; Ferreira, M; Moura, R; Ortigao, C ; Peralta, L ; Ribeiro, R; Rodrigues, P; Silva, JC; Trindade, A; Varela, J ; ...More
PUBLISHED: 2004, SOURCE: Nuclear Science Symposium/Medical Imaging Conference in 2004 IEEE Nuclear Science Symposium Conference Record, Vols 1-7, VOLUME: 6
INDEXED IN: Scopus WOS CrossRef: 9
IN MY: ORCID
16
TITLE: DARP - A digital audio reconfigurable processor
AUTHORS: de Sousa, JT; Goncalves, FM ; Barreiro, N; Moura, J;
PUBLISHED: 2002, SOURCE: 12th International Conference on Field-Programmable Logic and Applications in FIELD-PROGRAMMABLE LOGIC AND APPLICATIONS, PROCEEDINGS: RECONFIGURABLE COMPUTING IS GOING MAINSTREAM, VOLUME: 2438
INDEXED IN: Scopus WOS
IN MY: ORCID
17
TITLE: Design and test of a certifiable ASIC for a safety-critical gas burner control system  Full Text
AUTHORS: Goncalves, FM ; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2002, SOURCE: 7th IEEE International On-Line Testing Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 18, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID
18
TITLE: RTL design validation, DFT and test pattern generation for high defects coverage  Full Text
AUTHORS: Santos, MB ; Goncalves, FM ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2002, SOURCE: IEEE European Test Workshop (ETW 01) in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 18, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
19
TITLE: Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-Level
AUTHORS: Santos, MB ; Goncalves, FM ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2001, SOURCE: International Test Conference in INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS
INDEXED IN: Scopus WOS
IN MY: ORCID
20
TITLE: RTL-based functional test generation for high defects coverage in digital systems  Full Text
AUTHORS: Santos, MB ; Goncalves, FM ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 17, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef: 7
IN MY: ORCID
Page 2 of 4. Total results: 34.

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