Isabel Maria Silva Nobre Parreira Cacho Teixeira


AuthID: R-000-6DS

Confirmed Publications: 98



31
TITLE: Delay-Fault Tolerance to Power Supply Voltage Disturbances Analysis in Nanometer Technologies  Full Text
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
32
TITLE: Experimental characterization of the 192 channel Clear-PEM frontend ASIC coupled to a multi-pixel APD readout of LYSO:Ce crystals  Full Text
AUTHORS: Edgar Albuquerque; Vasco Bexiga; Ricardo Bugalho; Bruno Carrico; Claudia S Ferreira; Miguel Ferreira; Joaquim Godinho; Fernando Goncalves ; Carlos Leong; Pedro Lousa; Pedro Machado; Rui Moura; Pedro Neves; Catarina Ortigao ; Fernando Piedade; Joao F Pinheiro; Joel Rego; Angelo Rivetti; Pedro Rodrigues; Jose C Silva; Manuel M Silva ; Isabel C Teixeira ; Joao P Teixeira ; Andreia Trindade; Joao Varela ; ...More
PUBLISHED: 2009, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, VOLUME: 598, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef: 19
IN MY: ORCID
33
TITLE: High-Speed Data Acquisition Electronics for a PEM Scanner
AUTHORS: Lousa, P; Almeida, FG ; Almeida, P; Bastos, AL; Bexiga, V; Bugalho, R; Carmona, S; Carrico, B; Ferreira, CS; Ferreira, NC ; Ferreira, M; Godinho, J; Concalves, F ; Lecoq, P; Leong, C; Machado, P; Matela, N ; Moura, R; Neves, P; Oliveira, N; Ortigao, C ; Piedade, F; Pinheiro, JF; Relvas, P; Rivetti, A; Rodrigues, P; Sampaio, J; Santos, AI; Tavernier, S; Teixeira, IC ; Teixeira, JP ; Pimenta, N; Martins, MC; Silva, JC; Trindade, A; Varela, J ; ...More
PUBLISHED: 2009, SOURCE: 16th IEEE/NPSS Real-Time Conference in 2009 16TH IEEE-NPSS REAL TIME CONFERENCE
INDEXED IN: Scopus WOS CrossRef: 2
IN MY: ORCID
34
TITLE: Measuring Clock-Signal Modulation Efficiency for Systems-on-Chip in Electromagnetic Interference Environment
AUTHORS: Jorge Semião ; Freijedo, J; Moraes, M; Mallmann, M; Antunes, C ; Benfica, J; Vargas, F; Santos, M ; Teixeira, IC ; Rodriguez Andina, JJR; Teixeira, JP ; Lupi, D; Gatti, E; Garcia, L; Hernandez, F;
PUBLISHED: 2009, SOURCE: 10th Latin American Test Workshop in LATW: 2009 10TH LATIN AMERICAN TEST WORKSHOP
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
35
TITLE: Delay modeling for power noise and temperature-aware design and test of digital systems
AUTHORS: Freijedo, JF; Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2008, SOURCE: Journal of Low Power Electronics, VOLUME: 4, ISSUE: 3
INDEXED IN: Scopus CrossRef
IN MY: ORCID
36
TITLE: Experimental validation and performance analysis of the clear-PEM data acquisition electronics
AUTHORS: Bugalho, R; Bexiga, V; Carrico, B; Ferreira, CS; Ferreira, M; Ferreira, NC; Leong, C; Lousa, P; Machado, P; Moura, R; Neves, P; Ortigao, C ; Piedade, F; Rego, J; Rodrigues, P; Teixeira, IC ; Teixeira, JP ; Silva, JC; Trindade, A; Varela, J ;
PUBLISHED: 2008, SOURCE: 2008 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2008 in IEEE Nuclear Science Symposium Conference Record
INDEXED IN: Scopus CrossRef
IN MY: ORCID
37
TITLE: Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits
AUTHORS: Jorge Semião ; Freijedo, J; Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 14th IEEE International On-Line Testing Symposium in 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
38
TITLE: Power-Supply Instability Aware Clock Signal Modulation for Digital Integrated Circuits
AUTHORS: Jorge Semião ; Freijedo, J; Moraes, M; Mallmann, M; Antunes, C ; Rocha, L; Benfica, J; Vargas, F; Santos, M ; Teixeira, IC ; Rodriguez Andina, JJR; Teixeira, JP; Lupi, D; Gatti, E; Garcia, L; Hernandez, F;
PUBLISHED: 2008, SOURCE: International Symposium on Electromagnetic Compatibility in 2008 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE)
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
39
TITLE: Process tolerant design using thermal and power-supply tolerance in pipeline based circuits
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 11th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in 2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
40
TITLE: Robust Solution for Synchronous Communication among Multi Clock Domains
AUTHORS: Jorge Semião ; Varela, J ; Freijedo, J; Andina, J; Leong, C; Teixeira, JP ; Teixeira, I ;
PUBLISHED: 2008, SOURCE: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008) in 2008 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2008), VOLS 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
Page 4 of 10. Total results: 98.

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