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TITLE: Modeling and simulation of time domain faults in digital systems
AUTHORS: Junior, DB; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2004, SOURCE: Proceedings - 10th IEEE International On-Line Testing Symposium, IOLTS 2004 in Proceedings - 10th IEEE International On-Line Testing Symposium, IOLTS 2004

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TITLE: On high-quality, low energy built-in self test preparation at RT-level Full Text
AUTHORS: Santos, MB ; Teixeira, IC ; Teixeira, JP ; Manich, S; Balado, L; Figueras, J;
PUBLISHED: 2004, SOURCE: 3rd IEEE Latin-American Test Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 20, ISSUE: 4

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TITLE: Overview of the ECAL off-detector electronics of the CMS experiment
AUTHORS: Alemany, R; Almeida, CB ; Almeida, N; Bercher, M; Benetta, R; Bexiga, V; Bourotte, J; Busson, P; Cardoso, N; Cerrutti, M; Dejardin, M; Faure, JL; Gachelin, O; Gastal, M; Geerebaert, Y; Gilly, J; Gras, P; Hansen, M; Husejko, M; Jain, A; Karar, A; Kloukinas, K; Ljuslin, C; Machado, R; Manjavidze, I; Mur, M; Paganini, P; Regnault, N; Santos, M ; Silva, JCD; Teixeira, I ; Teixeira, JP ; Varela, J ; Verrecchia, P; Zlatevski, L; ...More
PUBLISHED: 2004, SOURCE: Nuclear Science Symposium/Medical Imaging Conference in 2004 IEEE Nuclear Science Symposium Conference Record, Vols 1-7, VOLUME: 2

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TITLE: Design and test of a certifiable ASIC for a safety-critical gas burner control system Full Text
AUTHORS: Goncalves, FM ; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2002, SOURCE: 7th IEEE International On-Line Testing Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 18, ISSUE: 3

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TITLE: RTL design validation, DFT and test pattern generation for high defects coverage Full Text
AUTHORS: Santos, MB ; Goncalves, FM ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2002, SOURCE: IEEE European Test Workshop (ETW 01) in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 18, ISSUE: 2

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TITLE: RTL level preparation of high-quality/low-energy/low-power BIST
AUTHORS: Santos, MB ; Teixeira, IC ; Teixeira, JP ; Manich, S; Rodriguez, R; Figueras, J;
PUBLISHED: 2002, SOURCE: International Test Conference in INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS

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TITLE: Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-Level
AUTHORS: Santos, MB ; Goncalves, FM ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2001, SOURCE: International Test Conference in INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS

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TITLE: On identifying and evaluating object architectures for real-time applications Full Text
AUTHORS: Dias, OP; Teixeira, IM ; Teixeira, JP ; Becker, LB; Pereira, CE;
PUBLISHED: 2001, SOURCE: 6th IFAC Workshop on Algorithms and Architectures for Real-Time Control (AARTC 2000) in CONTROL ENGINEERING PRACTICE, VOLUME: 9, ISSUE: 4

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