Marcelino Bicho dos Santos
AuthID: R-000-A9P
41
TITLE: <title>A 100mA fractional step-down charge pump with digital control</title>
AUTHORS: Valter A L Sadio; Abílio E M Parreira; Marcelino B Santos;
PUBLISHED: 2009, SOURCE: VLSI Circuits and Systems IV
AUTHORS: Valter A L Sadio; Abílio E M Parreira; Marcelino B Santos;
PUBLISHED: 2009, SOURCE: VLSI Circuits and Systems IV
42
TITLE: Noise Minimization for Low Power Bandgap Reference and Low Dropout Regulator Cores
AUTHORS: Ângelo Monteiro; Marcelino Santos; Alexandre Neves; Nuno Dias;
PUBLISHED: 2009, SOURCE: Journal of Low Power Electronics, VOLUME: 5, ISSUE: 2
AUTHORS: Ângelo Monteiro; Marcelino Santos; Alexandre Neves; Nuno Dias;
PUBLISHED: 2009, SOURCE: Journal of Low Power Electronics, VOLUME: 5, ISSUE: 2
43
TITLE: The CMS experiment at the CERN LHC
AUTHORS: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...More
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 8
AUTHORS: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...More
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 8
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44
TITLE: The CMS experiment at the CERN LHC
AUTHORS: The CMS Collaboration; Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Erö, J; Friedl, M; Frühwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Hänsel, S; Jeitler, M; ...More
PUBLISHED: 2008, SOURCE: J. Inst. - Journal of Instrumentation, VOLUME: 3, ISSUE: 08
AUTHORS: The CMS Collaboration; Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Erö, J; Friedl, M; Frühwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Hänsel, S; Jeitler, M; ...More
PUBLISHED: 2008, SOURCE: J. Inst. - Journal of Instrumentation, VOLUME: 3, ISSUE: 08
45
TITLE: Probabilistic testability analysis and DFT methods at RTL
AUTHORS: Jose M Fernandes; Marcelino B Santos; Arlindo L Oliveira ; Joao C Teixeira;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
AUTHORS: Jose M Fernandes; Marcelino B Santos; Arlindo L Oliveira ; Joao C Teixeira;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
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46
TITLE: Functional-oriented BIST of sequential circuits aiming at dynamic faults coverage
AUTHORS: Guerreiro, F; Jorge Semião ; Pierce, A; Santos, MB; Teixeira, IM ; Teixeira, JP ;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, VOLUME: 2006
AUTHORS: Guerreiro, F; Jorge Semião ; Pierce, A; Santos, MB; Teixeira, IM ; Teixeira, JP ;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, VOLUME: 2006
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47
TITLE: Improving the tolerance of pipeline based circuits to power supply or temperature variations
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2005, SOURCE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2005, SOURCE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
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48
TITLE: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip Full Text
AUTHORS: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLISHED: 2005, SOURCE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, ISSUE: 4
AUTHORS: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLISHED: 2005, SOURCE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, ISSUE: 4
49
TITLE: Modeling and simulation of time domain faults in digital systems
AUTHORS: Barros, D; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2004, SOURCE: 10th IEEE International On-Line Testing Symposium in 10TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
AUTHORS: Barros, D; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2004, SOURCE: 10th IEEE International On-Line Testing Symposium in 10TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
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50
TITLE: RTL test pattern generation for high quality loosely deterministic BIST Full Text
AUTHORS: Santos, MB; Fernandes, JM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2003, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 03) in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS
AUTHORS: Santos, MB; Fernandes, JM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2003, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 03) in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS
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