V. Champac
AuthID: R-00F-9FW
1
TITLE: Delay sensing for long-term variations and defects monitoring in safety-critical applications Full Text
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Teixeira, IC; Santos, MB; Teixeira, JP;
PUBLISHED: 2012, SOURCE: ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, VOLUME: 70, ISSUE: 2
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Teixeira, IC; Santos, MB; Teixeira, JP;
PUBLISHED: 2012, SOURCE: ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, VOLUME: 70, ISSUE: 2
2
TITLE: Adaptive Error-Prediction Flip-flop for Performance Failure Prediction with Aging Sensors
AUTHORS: Martins, CV; Jorge Semião ; Vazquez, JC; Champac, V; Santos, M ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 29th IEEE VLSI Test Symposium (VTS)/Workshop on Design for Reliability and Variability (DRV) in 2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS)
AUTHORS: Martins, CV; Jorge Semião ; Vazquez, JC; Champac, V; Santos, M ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 29th IEEE VLSI Test Symposium (VTS)/Workshop on Design for Reliability and Variability (DRV) in 2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS)
