Judit Fernández Freijedo
AuthID: R-001-MJC
11
TITLE: Delay-Fault Tolerance to Power Supply Voltage Disturbances Analysis in Nanometer Technologies Full Text
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
12
TITLE: Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits
AUTHORS: Jorge Semião ; Freijedo, J; Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 14th IEEE International On-Line Testing Symposium in 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
AUTHORS: Jorge Semião ; Freijedo, J; Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 14th IEEE International On-Line Testing Symposium in 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
13
TITLE: Robust Solution for Synchronous Communication among Multi Clock Domains
AUTHORS: Jorge Semião ; Varela, J ; Freijedo, J; Andina, J; Leong, C; Teixeira, JP ; Teixeira, I ;
PUBLISHED: 2008, SOURCE: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008) in 2008 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2008), VOLS 1-4
AUTHORS: Jorge Semião ; Varela, J ; Freijedo, J; Andina, J; Leong, C; Teixeira, JP ; Teixeira, I ;
PUBLISHED: 2008, SOURCE: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008) in 2008 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2008), VOLS 1-4
14
TITLE: Power-Supply Instability Aware Clock Signal Modulation for Digital Integrated Circuits
AUTHORS: Jorge Semião ; Freijedo, J; Moraes, M; Mallmann, M; Antunes, C ; Rocha, L; Benfica, J; Vargas, F; Santos, M ; Teixeira, IC ; Rodriguez Andina, JJR; Teixeira, JP; Lupi, D; Gatti, E; Garcia, L; Hernandez, F;
PUBLISHED: 2008, SOURCE: International Symposium on Electromagnetic Compatibility in 2008 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE)
AUTHORS: Jorge Semião ; Freijedo, J; Moraes, M; Mallmann, M; Antunes, C ; Rocha, L; Benfica, J; Vargas, F; Santos, M ; Teixeira, IC ; Rodriguez Andina, JJR; Teixeira, JP; Lupi, D; Gatti, E; Garcia, L; Hernandez, F;
PUBLISHED: 2008, SOURCE: International Symposium on Electromagnetic Compatibility in 2008 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE)
15
TITLE: Delay modeling for power noise and temperature-aware design and test of digital systems
AUTHORS: Freijedo, JF; Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2008, SOURCE: Journal of Low Power Electronics, VOLUME: 4, ISSUE: 3
AUTHORS: Freijedo, JF; Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2008, SOURCE: Journal of Low Power Electronics, VOLUME: 4, ISSUE: 3
INDEXED IN: 
Scopus 
CrossRef
Scopus CrossRef16
TITLE: Time Management for Low-Power Design of Digital Systems
AUTHORS: Jorge Semião ; Freijedo, JF; Rodriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2008, SOURCE: Journal of Low Power Electronics, VOLUME: 4, ISSUE: 3
AUTHORS: Jorge Semião ; Freijedo, JF; Rodriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2008, SOURCE: Journal of Low Power Electronics, VOLUME: 4, ISSUE: 3
INDEXED IN: Scopus CrossRef
Scopus CrossRef17
TITLE: Enhancing the tolerance to power-supply instability in digital circuits
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez J R Andina; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2007, SOURCE: IEEE-Computer-Society Annual Symposium on VLSI in IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, PROCEEDINGS: EMERGING VLSI TECHNOLOGIES AND ARCHITECTURES
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez J R Andina; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2007, SOURCE: IEEE-Computer-Society Annual Symposium on VLSI in IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, PROCEEDINGS: EMERGING VLSI TECHNOLOGIES AND ARCHITECTURES
18
TITLE: Improving tolerance to power-supply and temperature variations in synchronous circuits
AUTHORS: Jorge Semião ; Freijedo, J; Rodiriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2007, SOURCE: 10th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
AUTHORS: Jorge Semião ; Freijedo, J; Rodiriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2007, SOURCE: 10th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
19
TITLE: On-line dynamic delay insertion to improve signal integrity in synchronous circuits
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2007, SOURCE: 13th IEEE International On-Line Testing Symposium in 13TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM PROCEEDINGS
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2007, SOURCE: 13th IEEE International On-Line Testing Symposium in 13TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM PROCEEDINGS
