João Paulo Cacho Teixeira
AuthID: R-000-7A4
181
TITLE: On Restoring Data Coherence in a GALS System for Medical Imaging
AUTHORS: Leong, C; Machado, P; Bexiga, V; Teixeira, JP; Teixeira, IC; Lousa, P; Bugalho, R; Ferreira, M; Rodrigues, P; Silva, JC; Varela, J;
PUBLISHED: 2010, SOURCE: 1st IEEE Latin American Symposium on Circuits and Systems (LASCAS) in 2010 FIRST IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS)
AUTHORS: Leong, C; Machado, P; Bexiga, V; Teixeira, JP; Teixeira, IC; Lousa, P; Bugalho, R; Ferreira, M; Rodrigues, P; Silva, JC; Varela, J;
PUBLISHED: 2010, SOURCE: 1st IEEE Latin American Symposium on Circuits and Systems (LASCAS) in 2010 FIRST IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS)
INDEXED IN: 
WOS
WOS182
TITLE: Delay Sensing for Parametric Variations and Defects Monitoring in Safety-Critical Applications
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Teixeira, IC; Santos, MB; Teixeira, JP;
PUBLISHED: 2010, SOURCE: 1st IEEE Latin American Symposium on Circuits and Systems (LASCAS) in 2010 FIRST IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS)
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Teixeira, IC; Santos, MB; Teixeira, JP;
PUBLISHED: 2010, SOURCE: 1st IEEE Latin American Symposium on Circuits and Systems (LASCAS) in 2010 FIRST IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS)
INDEXED IN: WOS
WOS183
TITLE: Programmable Aging Sensor for Automotive Safety-Critical Applications
AUTHORS: Vazquez, JC; Champac, V; Teixeira, IC; Santos, MB; Teixeira, JP;
PUBLISHED: 2010, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE) in 2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010)
AUTHORS: Vazquez, JC; Champac, V; Teixeira, IC; Santos, MB; Teixeira, JP;
PUBLISHED: 2010, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE) in 2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010)
INDEXED IN: WOS
WOS184
TITLE: Built-In Clock Domain Crossing (CDC) Test and Diagnosis in GALS Systems
AUTHORS: Leong, C; Machado, P; Bexiga, V; Teixeira, JP; Teixeira, IC; Silva, JC; Lousa, P; Varela, J;
PUBLISHED: 2010, SOURCE: 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems in PROCEEDINGS OF THE 13TH IEEE SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS
AUTHORS: Leong, C; Machado, P; Bexiga, V; Teixeira, JP; Teixeira, IC; Silva, JC; Lousa, P; Varela, J;
PUBLISHED: 2010, SOURCE: 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems in PROCEEDINGS OF THE 13TH IEEE SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS
INDEXED IN: WOS
WOS185
TITLE: Genetic effects and biotoxicity monitoring of occupational styrene exposure Full Text
AUTHORS: Jose Rueff ; Joao P Teixeira; Luis Silva Santos; Jorge Francisco Gaspar ;
PUBLISHED: 2009, SOURCE: CLINICA CHIMICA ACTA, VOLUME: 399, ISSUE: 1-2
AUTHORS: Jose Rueff ; Joao P Teixeira; Luis Silva Santos; Jorge Francisco Gaspar ;
PUBLISHED: 2009, SOURCE: CLINICA CHIMICA ACTA, VOLUME: 399, ISSUE: 1-2
186
TITLE: Delay-Fault Tolerance to Power Supply Voltage Disturbances Analysis in Nanometer Technologies Full Text
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
187
TITLE: Parameterization of convective boundary layer turbulence and clouds in atmospheric models
AUTHORS: Soares, PMM; Teixeira, J; Miranda, PMA;
PUBLISHED: 2009, SOURCE: Air Pollution and Turbulence: Modeling and Applications
AUTHORS: Soares, PMM; Teixeira, J; Miranda, PMA;
PUBLISHED: 2009, SOURCE: Air Pollution and Turbulence: Modeling and Applications
INDEXED IN: 
Scopus
Scopus188
TITLE: Genotoxic damage in pathology anatomy laboratory workers exposed to formaldehyde Full Text
AUTHORS: Solange Costa; Patricia Coelho; Carla Costa ; Susana Silva; Olga Mayan; Luis Silva Santos; Jorge Gaspar ; Joao Paulo Teixeira;
PUBLISHED: 2008, SOURCE: TOXICOLOGY, VOLUME: 252, ISSUE: 1-3
AUTHORS: Solange Costa; Patricia Coelho; Carla Costa ; Susana Silva; Olga Mayan; Luis Silva Santos; Jorge Gaspar ; Joao Paulo Teixeira;
PUBLISHED: 2008, SOURCE: TOXICOLOGY, VOLUME: 252, ISSUE: 1-3
189
TITLE: Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits
AUTHORS: Jorge Semião ; Freijedo, J; Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 14th IEEE International On-Line Testing Symposium in 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
AUTHORS: Jorge Semião ; Freijedo, J; Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 14th IEEE International On-Line Testing Symposium in 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
190
TITLE: Process tolerant design using thermal and power-supply tolerance in pipeline based circuits
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 11th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in 2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2008, SOURCE: 11th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in 2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
