Nuno Pessoa Barradas


AuthID: R-000-DV0

Publicações Confirmadas: 263



221
TÍTULO: Growth of microcrystalline beta-SiC films on silicon by ECR plasma CVD  Full Text
AUTORES: Toal, SJ; Reehal, HS; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 1999, FONTE: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96) in APPLIED SURFACE SCIENCE, VOLUME: 138, NÚMERO: 1-4
INDEXADO EM: Scopus WOS CrossRef
NO MEU: ORCID | ResearcherID
222
TÍTULO: High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms
AUTORES: Barradas, NP ; Knights, AP; Jeynes, C; Mironov, OA; Grasby, TJ; Parker, EHC;
PUBLICAÇÃO: 1999, FONTE: PHYSICAL REVIEW B, VOLUME: 59, NÚMERO: 7
INDEXADO EM: Scopus WOS CrossRef
NO MEU: ORCID | ResearcherID
223
TÍTULO: Processing and characterisation of sol-gel deposited Ta2O5 and TiO2-Ta2O5 dielectric thin films  Full Text
AUTORES: Cappellani, A; Keddie, JL; Barradas, NP ; Jackson, SM;
PUBLICAÇÃO: 1999, FONTE: Symposium on Materials and Processes for Submicron Technologies, at the E-MRS Spring Meeting in SOLID-STATE ELECTRONICS, VOLUME: 43, NÚMERO: 6
INDEXADO EM: Scopus WOS CrossRef
NO MEU: ORCID | ResearcherID
224
TÍTULO: Rapid accurate automated analysis of complex ion beam analysis data
AUTORES: Marriott, PK; Jenkin, M; Jeynes, C; Barradas, NP ; Webb, RP; Sealy, BJ;
PUBLICAÇÃO: 1999, FONTE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
INDEXADO EM: WOS
NO MEU: ResearcherID
225
TÍTULO: RBS/simulated annealing and FTIR characterisation of BCN films deposited by dual cathode magnetron sputtering
AUTORES: Barradas, NP ; Jeynes, C; Kusano, Y; Evetts, JE; Hutchings, IM;
PUBLICAÇÃO: 1999, FONTE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
INDEXADO EM: WOS
NO MEU: ResearcherID
226
TÍTULO: RES and ERDA study of ion beam synthesised amorphous gallium nitride  Full Text
AUTORES: Barradas, NP ; Almeida, SA; Jeynes, C; Knights, AP; Silva, SRP; Sealy, BJ;
PUBLICAÇÃO: 1999, FONTE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, NÚMERO: 1-4
INDEXADO EM: Scopus WOS CrossRef
NO MEU: ORCID | ResearcherID
227
TÍTULO: Self ion irradiated Si probed with enhanced depth resolution positron annihilation spectroscopy  Full Text
AUTORES: Knights, AP; Nejim, A; Barradas, NP ; Coleman, PG;
PUBLICAÇÃO: 1999, FONTE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, NÚMERO: 1-4
INDEXADO EM: Scopus WOS CrossRef
NO MEU: ORCID | ResearcherID
228
TÍTULO: Simulated annealing analysis of nuclear reaction analysis measurements of polystyrene systems
AUTORES: Barradas, NP ; Smith, R;
PUBLICAÇÃO: 1999, FONTE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 32, NÚMERO: 22
INDEXADO EM: Scopus WOS CrossRef
NO MEU: ORCID | ResearcherID
229
TÍTULO: Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD  Full Text
AUTORES: Toal, SJ; Reehal, HS; Webb, SJ; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 1999, FONTE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, NÚMERO: 1-2
INDEXADO EM: Scopus WOS CrossRef
NO MEU: ORCID | ResearcherID
230
TÍTULO: The influence of implantation and annealing conditions on optical activity of Er3+ ions in 6H SiC  Full Text
AUTORES: Kozanecki, A; Jeynes, C; Barradas, NP ; Sealy, BJ; Jantsch, W;
PUBLICAÇÃO: 1999, FONTE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, NÚMERO: 1-4
INDEXADO EM: Scopus WOS CrossRef
NO MEU: ORCID | ResearcherID
Página 23 de 27. Total de resultados: 263.

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