Toggle navigation
Publicações
Investigadores
Instituições
0
Entrar
Autenticação Federada
(Clique na imagem)
Autenticação local
Recuperar Palavra-passe
Registar
Entrar
Nuno Pessoa Barradas
AuthID:
R-000-DV0
Publicações
Confirmadas
Para Validar
Document Source:
All
Document Type:
Todos os Tipos de Documentos
Article (230)
Proceedings Paper (28)
Review (2)
Erratum (1)
Correction (1)
Letter (1)
Year Start - End:
1993
1994
1995
1996
1997
1998
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
2024
2025
-
2025
2024
2023
2022
2021
2020
2019
2018
2017
2016
2015
2014
2013
2012
2011
2010
2009
2008
2007
2006
2005
2004
2003
2002
2001
2000
1999
1998
1997
1996
1995
1994
1993
Order:
Ano Dsc
Ano Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
Título Asc
Título Dsc
Results:
10
20
30
40
50
Publicações Confirmadas: 263
231
TÃTULO:
Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing
Full Text
AUTORES:
Barradas, NP
;
Jeynes, C
; Webb, RP; Kreissig, U;
Grotzschel, R
;
PUBLICAÇÃO:
1999
,
FONTE:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
149,
NÚMERO:
1-2
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
232
TÃTULO:
Defect tails in Ge implanted Si probed by slow positrons and ion channeling
AUTORES:
Knights, AP; Nejim, A;
Barradas, NP
; Gwilliam, R; Coleman, PG; Malik, F; Kherandish, H; Romani, S;
PUBLICAÇÃO:
1998
,
FONTE:
Materials-Research-Society Symposium on Silicon Front-End Technology - Materials Processing and Modelling
in
SILICON FRONT-END TECHNOLOGY-MATERIALS PROCESSING AND MODELLING,
VOLUME:
532
INDEXADO EM:
Scopus
WOS
NO MEU:
ORCID
|
ResearcherID
233
TÃTULO:
High depth resolution Rutherford backscattering analysis of Si-Si0.78Ge0.22/(0 0 1)Si superlattices
Full Text
AUTORES:
Barradas, NP
;
Jeynes, C
; Mironov, OA; Phillips, PJ; Parker, EHC;
PUBLICAÇÃO:
1998
,
FONTE:
5th European Conference on Accelerators in Applied Research and Technology (ECAART5)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
139,
NÚMERO:
1-4
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
234
TÃTULO:
High precision Rutherford backscattering characterisation of 3-D objects implanted by plasma immersion ion implantation
Full Text
AUTORES:
Barradas, NP
;
PUBLICAÇÃO:
1998
,
FONTE:
13th International Conference on Ion Beam Analysis (IBA-13)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
136
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
235
TÃTULO:
Improved ion beam analysis facilities at the University of Surrey
Full Text
AUTORES:
Jeynes, C
;
Barradas, NP
; Blewett, MJ; Webb, RP;
PUBLICAÇÃO:
1998
,
FONTE:
13th International Conference on Ion Beam Analysis (IBA-13)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
136
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
236
TÃTULO:
RBS/simulated annealing analysis of buried SiCOx layers formed by implantation of O into cubic silicon carbide
Full Text
AUTORES:
Barradas, NP
;
Jeynes, C
; Jackson, SM;
PUBLICAÇÃO:
1998
,
FONTE:
13th International Conference on Ion Beam Analysis (IBA-13)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
136
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
237
TÃTULO:
RBS/simulated annealing analysis of iron-cobalt silicides
Full Text
AUTORES:
Barradas, NP
;
Jeynes, C
; Harry, MA;
PUBLICAÇÃO:
1998
,
FONTE:
13th International Conference on Ion Beam Analysis (IBA-13)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
136
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
238
TÃTULO:
RBS/simulated annealing analysis of silicide formation in Fe/Si systems
Full Text
AUTORES:
Barradas, NP
;
Jeynes, C
; Homewood, KP; Sealy, BJ; Milosavljevic, M;
PUBLICAÇÃO:
1998
,
FONTE:
5th European Conference on Accelerators in Applied Research and Technology (ECAART5)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
139,
NÚMERO:
1-4
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
239
TÃTULO:
Residual post anneal damage of Ge and C co-implantation of Si determined by quantitative RBS-channelling
Full Text
AUTORES:
Nejim, A;
Barradas, NP
;
Jeynes, C
; Cristiano, F;
Wendler, E
; Gartner, K; Sealy, BJ;
PUBLICAÇÃO:
1998
,
FONTE:
5th European Conference on Accelerators in Applied Research and Technology (ECAART5)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
139,
NÚMERO:
1-4
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
240
TÃTULO:
The RBS data furnace: Simulated annealing
Full Text
AUTORES:
Barradas, NP
; Marriott, PK;
Jeynes, C
; Webb, RP;
PUBLICAÇÃO:
1998
,
FONTE:
13th International Conference on Ion Beam Analysis (IBA-13)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
136
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
Adicionar à lista
Marked
Marcar Todas
Exportar
×
Publication Export Settings
BibTex
EndNote
APA
CSV
PDF
Export Preview
Print
×
Publication Print Settings
HTML
PDF
Print Preview
Página 24 de 27. Total de resultados: 263.
<<
<
19
20
21
22
23
24
25
26
27
>
>>
×
Selecione a Fonte
Esta publicação tem:
2 registos no
ISI
2 registos no
SCOPUS
2 registos no
DBLP
2 registos no
Unpaywall
2 registos no
Openlibrary
2 registos no
Handle
2 registos no
DataCite
Por favor selecione o registo que deve ser utilizado pelo Authenticus.
×
Comparar Publicações
© 2025 CRACS & Inesc TEC - All Rights Reserved
Política de Privacidade
|
Terms of Service