Eduardo Jorge da Costa Alves


AuthID: R-000-4EK

Confirmed Publications: 597



221
TITLE: A comparative investigation of the damage build-up in GaN and Si during rare earth ion implantation  Full Text
AUTHORS: Florence Gloux; Pierre Ruterana; Lorenz, K ; Alves, E ;
PUBLISHED: 2008, SOURCE: 2nd Workshop on Impurity Based Electroluminescent Devices and Materials (IBEDM 2006) in PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 205, ISSUE: 1
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222
TITLE: A comparative structural investigation of GaN implanted with rare earth ions at room temperature and 500 degrees C  Full Text
AUTHORS: Gloux, F; Ruterana, P; Lorenz, K ; Alves, E ;
PUBLISHED: 2008, SOURCE: Meeting of the European-Materials-Research-Society in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 146, ISSUE: 1-3
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223
TITLE: Anisotropy effects on the formation of new phases in alpha-Al2O3 by high fluence Zn implantation  Full Text
AUTHORS: Marques, C; Franco, N; da Silva, RC; McHargue, C; Alves, E ;
PUBLISHED: 2008, SOURCE: 14th International Conference on Radiation Effects in Insulators (REI-14) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 266, ISSUE: 12-13
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224
TITLE: Charging effects in CdSe nanocrystals embedded in SiO2 matrix produced by rf magnetron sputtering  Full Text
AUTHORS: Levichev, S ; Chahboun, A ; Basa, P; Rolo, AG ; Barradas, NP ; Alves, E ; Zs J Horvath; Conde, O ; Gomes, MJM ;
PUBLISHED: 2008, SOURCE: Symposium on Materials and Emerging Technologies for Non-Volatile-Memory Devices held at the 2008 EMRS Spring Meeting in MICROELECTRONIC ENGINEERING, VOLUME: 85, ISSUE: 12
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225
226
TITLE: Comparison of ZnO thin films grown by pulsed laser deposition on sapphire and Si substrates  Full Text
AUTHORS: Han, L; Mei, F; Liu, C; Pedro, C; Alves, E ;
PUBLISHED: 2008, SOURCE: PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, VOLUME: 40, ISSUE: 3
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227
TITLE: Defect studies on fast and thermal neutron irradiated GaN  Full Text
AUTHORS: Lorenz, K ; Marques, JG ; Franco, N; Alves, E ; Peres, M; Correia, MR ; Monteiro, T ;
PUBLISHED: 2008, SOURCE: 14th International Conference on Radiation Effects in Insulators (REI-14) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 266, ISSUE: 12-13
INDEXED IN: Scopus WOS CrossRef: 10
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228
TITLE: Determination of non-Rutherford cross-sections from simple RBS spectra using Bayesian inference data analysis  Full Text
AUTHORS: Barradas, NP ; Ramos, AR ; Alves, E ;
PUBLISHED: 2008, SOURCE: 18th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 266, ISSUE: 8
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229
TITLE: Effect of post-annealing on the properties of copper oxide thin films obtained from the oxidation of evaporated metallic copper  Full Text
AUTHORS: Figueiredo, V; Elangovan, E; Goncalves, G; Barquinha, P ; Pereira, L ; Franco, N; Alves, E ; Martins, R ; Fortunato, E ;
PUBLISHED: 2008, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 254, ISSUE: 13
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230
TITLE: Effect of thermal treatments on the structure of MoNxOy thin films  Full Text
AUTHORS: Cunha, L ; Rebouta, L ; Vaz, F ; Staszuk, M; Malara, S; Barbosa, J; Carvalho, P; Alves, E ; Le Bourhis, E; Ph. Goudeau; Riviere, JP;
PUBLISHED: 2008, SOURCE: 5th Iberian Vacuum Meeting in VACUUM, VOLUME: 82, ISSUE: 12
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Página 23 de 60. Total de resultados: 597.

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