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Eduardo Jorge da Costa Alves
AuthID:
R-000-4EK
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Article (512)
Proceedings Paper (76)
Correction (4)
Review (2)
Editorial Material (2)
Erratum (1)
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Publicações Confirmadas: 597
541
TÃTULO:
Luminescence studies in colour centres produced in natural topaz
Full Text
AUTORES:
Marques, C
; Santos, L;
Falcao, AN
;
Silva, RC
;
Alves, E
;
PUBLICAÇÃO:
2000
,
FONTE:
International Conference on Luminescence and Optical Spectroscopy of Condensed Matter
in
JOURNAL OF LUMINESCENCE,
VOLUME:
87-9
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
542
TÃTULO:
Micron-scale analysis of SiC/SiCf composites using the new Lisbon nuclear microprobe
Full Text
AUTORES:
Alves, LC
;
Breese, MBH
;
Alves, E
; Paul, A;
da Silva, MR
; da Silva, MF;
Soares, JC
;
PUBLICAÇÃO:
2000
,
FONTE:
14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
161
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
543
TÃTULO:
Molecular H-2 and H-3 energy loss measurements along the Si < 111 > direction
Full Text
AUTORES:
Behar, M; Grande, PL; Azevedo, GD;
Alves, E
; da Silva, MF;
Soares, JC
;
PUBLICAÇÃO:
2000
,
FONTE:
14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
161
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
544
TÃTULO:
RBS/channeling study of Er doped GaN films grown by MBE on Si(111) substrates
Full Text
AUTORES:
Lorenz, K
; Vianden, R; Birkhahn, R; Steckl, AJ; da Silva, MF;
Soares, JC
;
Alves, E
;
PUBLICAÇÃO:
2000
,
FONTE:
14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
161
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
545
TÃTULO:
Structural and magnetic studies of Fe-implanted alpha-Al2O3
Full Text
AUTORES:
Alves, E
; MacHargue, C;
Silva, RC
;
Jesus, C
;
Conde, O
; de Silva, MF;
Soares, JC
;
PUBLICAÇÃO:
2000
,
FONTE:
11th International Conference on Surface Modification of Metals by Ion Beams (SMMIB-99)
in
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
128,
NÚMERO:
1
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
546
TÃTULO:
Structure determination of (Ti,Al)N/Mo multilayers
Full Text
AUTORES:
Tavares, CJ
;
Rebouta, L
;
Alves, EJ
;
PUBLICAÇÃO:
2000
,
FONTE:
11th International Conference on Thin Films (ICTF-11)
in
THIN SOLID FILMS,
VOLUME:
373,
NÚMERO:
1-2
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
547
TÃTULO:
Surface studies of SiC/SiCf composites exposed to relevant fusion reactor conditions
Full Text
AUTORES:
Alves, LC
; Paul, A;
Alves, E
; da Silva, MF;
Soares, JC
;
Rebouta, L
; La Barbera, A; Riccordi, B; Centeno, MA; Odriozola, JA;
PUBLICAÇÃO:
2000
,
FONTE:
8th European Conference on Applications of Surface and Interface Analysis
in
SURFACE AND INTERFACE ANALYSIS,
VOLUME:
30,
NÚMERO:
1
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
548
TÃTULO:
Annealing behavior and lattice site location of Hf implanted GaN
Full Text
AUTORES:
Alves, E
; da Silva, MF;
Marques, JG
;
Soares, JC
; Freitag, K;
PUBLICAÇÃO:
1999
,
FONTE:
Proceedings of the 1998 Symposium L: on Nitrides and Related Wide Band Gap Materials (E-MRS Meeting)
in
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,
VOLUME:
59,
NÚMERO:
1-3
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
549
TÃTULO:
Characterisation of YBaCuO-PrBaCuO multilayers grown by pulsed injection MO-CVD
Full Text
AUTORES:
Galindo, V; Senateur, JP;
Alves, E
;
da Silva, RC
;
Silva, JA
;
Cruz, MM
;
Godinho, M
;
Casaca, A
;
Grégoire Bonfait
;
PUBLICAÇÃO:
1999
,
FONTE:
International Conference on Physics and Chemistry of Molecular and Oxide Superconductors (MOS-99)
in
JOURNAL OF LOW TEMPERATURE PHYSICS,
VOLUME:
117,
NÚMERO:
3-4
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
550
TÃTULO:
Effect of crystal orientation on damage accumulation and post-implantation annealing for iron implantation into sapphire
Full Text
AUTORES:
McHargue, CJ
;
Alves, E
; da Silva, MF;
Soares, JC
;
PUBLICAÇÃO:
1999
,
FONTE:
11th International Conference on Ion Beam Modification of Materials (IBMM98)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
148,
NÚMERO:
1-4
INDEXADO EM:
Scopus
WOS
CrossRef
NO MEU:
ORCID
|
ResearcherID
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