Rodrigo Ferrao Paiva Martins
AuthID: R-000-FKV
321
TITLE: Corrigendum to “Nickel assisted metal induced crystallization of silicon: Effect of native silicon oxide layer” [Thin Solid Films 511–512 (2006) 275–279] Full Text
AUTHORS: Pereira, L; R.M.S Martins; Schell, N; Fortunato, E; Martins, R;
PUBLISHED: 2007, SOURCE: Thin Solid Films, VOLUME: 516, ISSUE: 1
AUTHORS: Pereira, L; R.M.S Martins; Schell, N; Fortunato, E; Martins, R;
PUBLISHED: 2007, SOURCE: Thin Solid Films, VOLUME: 516, ISSUE: 1
322
TITLE: UV-Raman scattering study of lattice recovery by thermal annealing of Eu+-implanted GaN layers Full Text
AUTHORS: Pastor, D; Hernandez, S; Cusco, R; Artus, L; Martin, RW; O'Donnell, KP; Briot, O; Lorenz, K ; Alves, E ;
PUBLISHED: 2006, SOURCE: Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 40, ISSUE: 4-6
AUTHORS: Pastor, D; Hernandez, S; Cusco, R; Artus, L; Martin, RW; O'Donnell, KP; Briot, O; Lorenz, K ; Alves, E ;
PUBLISHED: 2006, SOURCE: Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 40, ISSUE: 4-6
323
TITLE: Blue cathodoluminescence from thulium implanted AlxGa1-xN and InxAl1-xN Full Text
AUTHORS: Roqan, IS; Lorenz, K ; O'Donnell, KP; Trager Cowan, C; Martin, RW; Watson, IM; Alves, E ;
PUBLISHED: 2006, SOURCE: Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 40, ISSUE: 4-6
AUTHORS: Roqan, IS; Lorenz, K ; O'Donnell, KP; Trager Cowan, C; Martin, RW; Watson, IM; Alves, E ;
PUBLISHED: 2006, SOURCE: Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 40, ISSUE: 4-6
324
TITLE: Local structure of luminescent InGaN alloys Full Text
AUTHORS: Kachkanov, V; O'Donnell, KP; Martin, RW; Mosselmans, JFW; Pereira, S ;
PUBLISHED: 2006, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 89, ISSUE: 10
AUTHORS: Kachkanov, V; O'Donnell, KP; Martin, RW; Mosselmans, JFW; Pereira, S ;
PUBLISHED: 2006, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 89, ISSUE: 10
325
TITLE: High temperature annealing of rare earth implanted GaN films: Structural and optical properties Full Text
AUTHORS: Lorenz, K ; Wahl, U ; Alves, E ; Nogales, E; Dalmasso, S; Martin, RW; O'Donnell, KP; Wojdak, M; Braud, A; Monteiro, T ; Wojtowicz, T; Ruterana, P; Ruffenach, S; Briot, O;
PUBLISHED: 2006, SOURCE: Meeting of the European-Materials-Research-Society in OPTICAL MATERIALS, VOLUME: 28, ISSUE: 6-7
AUTHORS: Lorenz, K ; Wahl, U ; Alves, E ; Nogales, E; Dalmasso, S; Martin, RW; O'Donnell, KP; Wojdak, M; Braud, A; Monteiro, T ; Wojtowicz, T; Ruterana, P; Ruffenach, S; Briot, O;
PUBLISHED: 2006, SOURCE: Meeting of the European-Materials-Research-Society in OPTICAL MATERIALS, VOLUME: 28, ISSUE: 6-7
326
TITLE: Optical properties of high-temperature annealed Eu-implanted GaN Full Text
AUTHORS: Wang, K; Martin, RW; Nogales, E; Katchkanov, V; O'Donnell, KP; Hernandez, S; Lorenz, K ; Alves, E ; Ruffenach, S; Briot, O;
PUBLISHED: 2006, SOURCE: Meeting of the European-Materials-Research-Society in OPTICAL MATERIALS, VOLUME: 28, ISSUE: 6-7
AUTHORS: Wang, K; Martin, RW; Nogales, E; Katchkanov, V; O'Donnell, KP; Hernandez, S; Lorenz, K ; Alves, E ; Ruffenach, S; Briot, O;
PUBLISHED: 2006, SOURCE: Meeting of the European-Materials-Research-Society in OPTICAL MATERIALS, VOLUME: 28, ISSUE: 6-7
327
TITLE: Failure mechanism of AlN nanocaps used to protect rare earth-implanted GaN during high temperature annealing Full Text
AUTHORS: Nogales, E; Martin, RW; O'Donnell, KP; Lorenz, K ; Alves, E ; Ruffenach, S; Briot, O;
PUBLISHED: 2006, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 88, ISSUE: 3
AUTHORS: Nogales, E; Martin, RW; O'Donnell, KP; Lorenz, K ; Alves, E ; Ruffenach, S; Briot, O;
PUBLISHED: 2006, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 88, ISSUE: 3
328
TITLE: Depth profiling of ion-implanted AlInN using time-of-flight secondary ion mass spectrometry and cathodoluminescence Full Text
AUTHORS: Martin, RW; Rading, D; Kersting, R; Tallarek, E; Nogales, E; Amabile, D; Wang, K; Katchkanov, V; Trager Cowan, C; O'Donnell, KP; Watson, IM; Matias, V; Vantomme, A; Lorenz, K ; Alves, E ;
PUBLISHED: 2006, SOURCE: 6th International Conference on Nitride Semiconductors (ICNS-6) in Physica Status Solidi C - Current Topics in Solid State Physics, Vol 3, No 6, VOLUME: 3, ISSUE: 6
AUTHORS: Martin, RW; Rading, D; Kersting, R; Tallarek, E; Nogales, E; Amabile, D; Wang, K; Katchkanov, V; Trager Cowan, C; O'Donnell, KP; Watson, IM; Matias, V; Vantomme, A; Lorenz, K ; Alves, E ;
PUBLISHED: 2006, SOURCE: 6th International Conference on Nitride Semiconductors (ICNS-6) in Physica Status Solidi C - Current Topics in Solid State Physics, Vol 3, No 6, VOLUME: 3, ISSUE: 6
329
TITLE: Investigation of a-Si:H 1D MIS position sensitive detectors for application in 3D sensors Full Text
AUTHORS: Águas, H; Pereira, L; Raniero, L; Costa, D; Fortunato, E; Martins, R;
PUBLISHED: 2006, SOURCE: Journal of Non-Crystalline Solids, VOLUME: 352, ISSUE: 9-20
AUTHORS: Águas, H; Pereira, L; Raniero, L; Costa, D; Fortunato, E; Martins, R;
PUBLISHED: 2006, SOURCE: Journal of Non-Crystalline Solids, VOLUME: 352, ISSUE: 9-20
330
TITLE: UV and ozone influence on the conductivity of ZnO thin films Full Text
AUTHORS: Gonçalves, G; Pimentel, A; Fortunato, E; Martins, R; E.L Queiroz; R.F Bianchi; R.M Faria;
PUBLISHED: 2006, SOURCE: Journal of Non-Crystalline Solids, VOLUME: 352, ISSUE: 9-20
AUTHORS: Gonçalves, G; Pimentel, A; Fortunato, E; Martins, R; E.L Queiroz; R.F Bianchi; R.M Faria;
PUBLISHED: 2006, SOURCE: Journal of Non-Crystalline Solids, VOLUME: 352, ISSUE: 9-20
