R. F. Wolffenbuttel
AuthID: R-006-FVH
51
TÃTULO: Compensation of temperature effects on the pull-in voltage of microstructures Full Text
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 17th European Conference on Solid-State Transducers (Eurosensors XVII) in SENSORS AND ACTUATORS A-PHYSICAL, VOLUME: 115, NÚMERO: 2-3
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 17th European Conference on Solid-State Transducers (Eurosensors XVII) in SENSORS AND ACTUATORS A-PHYSICAL, VOLUME: 115, NÚMERO: 2-3
52
TÃTULO: Full characterisation of pull-in in single-sided clamped beams Full Text
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: EUROSENSORS XVI Conference in SENSORS AND ACTUATORS A-PHYSICAL, VOLUME: 110, NÚMERO: 1-3
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: EUROSENSORS XVI Conference in SENSORS AND ACTUATORS A-PHYSICAL, VOLUME: 110, NÚMERO: 1-3
53
TÃTULO: Pull-in dynamics: Analysis and modeling of the transitional regime
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 17th IEEE International Conference on Micro Electro Mechanical Systems (MEMS): Maastricht MEMS 2004 Technical Digest in Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
AUTORES: Rocha, LA ; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: 17th IEEE International Conference on Micro Electro Mechanical Systems (MEMS): Maastricht MEMS 2004 Technical Digest in Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
INDEXADO EM: 
Scopus
Scopus54
TÃTULO: Analytical model for the pull-in time of low-Q MEMS devices
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
INDEXADO EM: 
WOS
WOS55
TÃTULO: X-ray detector based on a bulk micromachined photodiode combined with a scintillating crystal Full Text
AUTORES: Rocha, JG ; Schabmueller, CGJ; Ramos, NF; Lanceros Mendez, S ; Costa, MF ; Evans, AGR; Wolffenbuttel, RF; Correia, JH ;
PUBLICAÇÃO: 2003, FONTE: 13th European Micromechanics Workshop in JOURNAL OF MICROMECHANICS AND MICROENGINEERING, VOLUME: 13, NÚMERO: 4
AUTORES: Rocha, JG ; Schabmueller, CGJ; Ramos, NF; Lanceros Mendez, S ; Costa, MF ; Evans, AGR; Wolffenbuttel, RF; Correia, JH ;
PUBLICAÇÃO: 2003, FONTE: 13th European Micromechanics Workshop in JOURNAL OF MICROMECHANICS AND MICROENGINEERING, VOLUME: 13, NÚMERO: 4
56
TÃTULO: CMOS x-ray image sensor with pixel level A/D conversion
AUTORES: Rocha, JG; Ramos, NF; Wolffenbuttel, RF; Correia, JH ;
PUBLICAÇÃO: 2003, FONTE: 29th European Solid-State Circuits Conference in ESSCIRC 2003: PROCEEDINGS OF THE 29TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE
AUTORES: Rocha, JG; Ramos, NF; Wolffenbuttel, RF; Correia, JH ;
PUBLICAÇÃO: 2003, FONTE: 29th European Solid-State Circuits Conference in ESSCIRC 2003: PROCEEDINGS OF THE 29TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE
57
TÃTULO: Mechanical spectrum analyzer in silicon using micromachined accelerometers with time-varying electrostatic feedback
AUTORES: Rocha, LA ; Cretu, E; de Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
AUTORES: Rocha, LA ; Cretu, E; de Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
INDEXADO EM: WOS
WOS58
TÃTULO: Mechanical spectrum analyzer in silicon using micromachined accelerometers with time-varying electrostatic feedback
AUTORES: Rocha, LA ; Cretu, E; De Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Proceedings of the 20th IEEE Information and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
AUTORES: Rocha, LA ; Cretu, E; De Graaf, G; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Proceedings of the 20th IEEE Information and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXADO EM: Scopus
Scopus59
TÃTULO: Performance of integrated silicon infrared microspectrometers
AUTORES: Kong, SH; De Graaf, G; Rocha, LA ; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Proceedings of the 20th IEEE Information and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTORES: Kong, SH; De Graaf, G; Rocha, LA ; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Proceedings of the 20th IEEE Information and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXADO EM: Scopus
Scopus60
TÃTULO: A single-chip CMOS optical microspectrometer with light-to-frequency converter and bus interface
AUTORES: Correia, JH ; de Graaf, G; Bartek, M; Wolffenbuttel, RF;
PUBLICAÇÃO: 2002, FONTE: IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOLUME: 37, NÚMERO: 10
AUTORES: Correia, JH ; de Graaf, G; Bartek, M; Wolffenbuttel, RF;
PUBLICAÇÃO: 2002, FONTE: IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOLUME: 37, NÚMERO: 10
