C. Landrault
AuthID: R-00J-N1J
1
TÃTULO: Low power BIST by filtering non-detecting vectors Full Text
AUTORES: Manich, S; Gabarro, A; Lopez, M; Figueras, J; Girard, P; Guiller, L; Landrault, C; Pravossoudovitch, S; Teixeira, P ; Santos, M ;
PUBLICAÇÃO: 2000, FONTE: 6th IEEE International O-Line Testing Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 16, NÚMERO: 3
AUTORES: Manich, S; Gabarro, A; Lopez, M; Figueras, J; Girard, P; Guiller, L; Landrault, C; Pravossoudovitch, S; Teixeira, P ; Santos, M ;
PUBLICAÇÃO: 2000, FONTE: 6th IEEE International O-Line Testing Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 16, NÚMERO: 3
