João Paulo Cacho Teixeira
AuthID: R-000-7A4
161
TITLE: Towards e-management as enabler for accelerated change
AUTHORS: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
AUTHORS: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
INDEXED IN: 
Scopus
Scopus162
TITLE: RTL-based functional test generation for high defects coverage in digital SOCs
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: 
WOS
WOS163
TITLE: MOSYS: A methodology for automatic object identification from system specification
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
INDEXED IN: Scopus 
CrossRef
Scopus CrossRef164
TITLE: Metrics and criteria for quality assessment of testable Hw Sw systems architectures Full Text
AUTHORS: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLISHED: 1999, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, ISSUE: 1-2
AUTHORS: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLISHED: 1999, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, ISSUE: 1-2
165
TITLE: Testability issues in the CMS ECAL upper-level readout and trigger system
AUTHORS: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLISHED: 1999, SOURCE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
AUTHORS: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLISHED: 1999, SOURCE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
INDEXED IN: WOS
WOS166
TITLE: A concept and system architecture for IT-based Lifelong Learning Full Text
AUTHORS: Encarnacao, J; Mengel, M; Bono, P; Bohm, K; Borgmeier, E; Brisson Lopes, J; Hornung, C; Knierriem Jasnoch, A; Koch, E; Kromer, D; Lindner, R; Paris, C; Sandberg, A; Schnaider, M; Storck, D; Teixeira, J; Urban, B; Wang, T;
PUBLISHED: 1998, SOURCE: COMPUTERS & GRAPHICS-UK, VOLUME: 22, ISSUE: 2-3
AUTHORS: Encarnacao, J; Mengel, M; Bono, P; Bohm, K; Borgmeier, E; Brisson Lopes, J; Hornung, C; Knierriem Jasnoch, A; Koch, E; Kromer, D; Lindner, R; Paris, C; Sandberg, A; Schnaider, M; Storck, D; Teixeira, J; Urban, B; Wang, T;
PUBLISHED: 1998, SOURCE: COMPUTERS & GRAPHICS-UK, VOLUME: 22, ISSUE: 2-3
INDEXED IN: Scopus WOS
Scopus WOS167
TITLE: From continuing education to continuing learning using self assessment and process monitoring
AUTHORS: Teixeira, IC; Teixeira, JP; Pile, M; Durao, D;
PUBLISHED: 1998, SOURCE: 7th World Conference on Continuing Engineering Education: the Knowledge Revolution - the Impact of New Technologies o n Learning in KNOWLEDGE REVOLUTION, THE IMPACT OF TECHNOLOGY ON LEARNING, PROCEEDINGS
AUTHORS: Teixeira, IC; Teixeira, JP; Pile, M; Durao, D;
PUBLISHED: 1998, SOURCE: 7th World Conference on Continuing Engineering Education: the Knowledge Revolution - the Impact of New Technologies o n Learning in KNOWLEDGE REVOLUTION, THE IMPACT OF TECHNOLOGY ON LEARNING, PROCEEDINGS
INDEXED IN: WOS
WOS168
TITLE: Trends on microelectronic systems education
AUTHORS: Teixeira, IC; Teixeira, JP;
PUBLISHED: 1998, SOURCE: 2nd European Workshop on Microelectronics Education in MICROELECTRONICS EDUCATION
AUTHORS: Teixeira, IC; Teixeira, JP;
PUBLISHED: 1998, SOURCE: 2nd European Workshop on Microelectronics Education in MICROELECTRONICS EDUCATION
INDEXED IN: WOS
WOS169
TITLE: High-quality physical designs of CMOS ICs
AUTHORS: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLISHED: 1991, SOURCE: Euro ASIC 1991 in Euro ASIC 1991
AUTHORS: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLISHED: 1991, SOURCE: Euro ASIC 1991 in Euro ASIC 1991
INDEXED IN: Scopus
Scopus