João Paulo Cacho Teixeira
AuthID: R-000-7A4
161
TÃTULO: Towards e-management as enabler for accelerated change
AUTORES: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
AUTORES: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
INDEXADO EM: 
Scopus
Scopus162
TÃTULO: RTL-based functional test generation for high defects coverage in digital SOCs
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXADO EM: 
WOS
WOS163
TÃTULO: MOSYS: A methodology for automatic object identification from system specification
AUTORES: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
AUTORES: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
INDEXADO EM: Scopus 
CrossRef
Scopus CrossRef164
TÃTULO: Metrics and criteria for quality assessment of testable Hw Sw systems architectures Full Text
AUTORES: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLICAÇÃO: 1999, FONTE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, NÚMERO: 1-2
AUTORES: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLICAÇÃO: 1999, FONTE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, NÚMERO: 1-2
165
TÃTULO: Testability issues in the CMS ECAL upper-level readout and trigger system
AUTORES: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLICAÇÃO: 1999, FONTE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
AUTORES: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLICAÇÃO: 1999, FONTE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
INDEXADO EM: WOS
WOS166
TÃTULO: A concept and system architecture for IT-based Lifelong Learning Full Text
AUTORES: Encarnacao, J; Mengel, M; Bono, P; Bohm, K; Borgmeier, E; Brisson Lopes, J; Hornung, C; Knierriem Jasnoch, A; Koch, E; Kromer, D; Lindner, R; Paris, C; Sandberg, A; Schnaider, M; Storck, D; Teixeira, J; Urban, B; Wang, T;
PUBLICAÇÃO: 1998, FONTE: COMPUTERS & GRAPHICS-UK, VOLUME: 22, NÚMERO: 2-3
AUTORES: Encarnacao, J; Mengel, M; Bono, P; Bohm, K; Borgmeier, E; Brisson Lopes, J; Hornung, C; Knierriem Jasnoch, A; Koch, E; Kromer, D; Lindner, R; Paris, C; Sandberg, A; Schnaider, M; Storck, D; Teixeira, J; Urban, B; Wang, T;
PUBLICAÇÃO: 1998, FONTE: COMPUTERS & GRAPHICS-UK, VOLUME: 22, NÚMERO: 2-3
INDEXADO EM: Scopus WOS
Scopus WOS167
TÃTULO: From continuing education to continuing learning using self assessment and process monitoring
AUTORES: Teixeira, IC; Teixeira, JP; Pile, M; Durao, D;
PUBLICAÇÃO: 1998, FONTE: 7th World Conference on Continuing Engineering Education: the Knowledge Revolution - the Impact of New Technologies o n Learning in KNOWLEDGE REVOLUTION, THE IMPACT OF TECHNOLOGY ON LEARNING, PROCEEDINGS
AUTORES: Teixeira, IC; Teixeira, JP; Pile, M; Durao, D;
PUBLICAÇÃO: 1998, FONTE: 7th World Conference on Continuing Engineering Education: the Knowledge Revolution - the Impact of New Technologies o n Learning in KNOWLEDGE REVOLUTION, THE IMPACT OF TECHNOLOGY ON LEARNING, PROCEEDINGS
INDEXADO EM: WOS
WOS168
TÃTULO: Trends on microelectronic systems education
AUTORES: Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 1998, FONTE: 2nd European Workshop on Microelectronics Education in MICROELECTRONICS EDUCATION
AUTORES: Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 1998, FONTE: 2nd European Workshop on Microelectronics Education in MICROELECTRONICS EDUCATION
INDEXADO EM: WOS
WOS169
TÃTULO: High-quality physical designs of CMOS ICs
AUTORES: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLICAÇÃO: 1991, FONTE: Euro ASIC 1991 in Euro ASIC 1991
AUTORES: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLICAÇÃO: 1991, FONTE: Euro ASIC 1991 in Euro ASIC 1991
INDEXADO EM: Scopus
Scopus