Spatially-Resolved Photocapacitance Measurements to Study Defects in A-Si : H Based P-I-N Particle Detectors

AuthID
 P-003-YKJ
11
Author(s)
Casteleiro, C
·
Wuensch, F
·
Kunst, M
·
Tipo de Documento
Article
Year published
2008
Publicado
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 516, Número: 15, Páginas: 5118-5121 (4)
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Publication Identifiers
SCOPUS: 2-s2.0-43049086627
Wos: WOS:000256509100075
Source Identifiers
ISSN: 0040-6090
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