Exploiting Parametric Power Supply And/Or Temperature Variations to Improve Fault Tolerance in Digital Circuits

AuthID
 P-004-53E
7
Author(s)
4
Editor(es)
Gizopoulos, D; Seifert, N; Nicolaidis, M; Paschalis, A
Tipo de Documento
Proceedings Paper
Year published
2008
Publicado
in 14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS in IEEE International On-Line Testing Symposium, ISSN: 1942-9398
Páginas: 227-232 (6)
Conference
14Th Ieee International On-Line Testing Symposium, Date: JUL 06-09, 2008, Location: Rhodes, GREECE, Patrocinadores: IEEE Comp Soc, Test Technol Tech Council, Univ Athens, Univ Piraeus, TIMA Lab
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Publication Identifiers
SCOPUS: 2-s2.0-52049084093
Wos: WOS:000257879900042
Source Identifiers
ISSN: 1942-9398
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