Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip

AuthID
 P-000-255
6
Author(s)
Burros, D
·
Rodriguez Irago, M
·
Vargas, F
·
Tipo de Documento
Article
Year published
2005
Publicado
in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 21, Número: 4, Páginas: 349-363 (15)
Conference
10Th Ieee International On-Line Testing Symposium, Date: JUL 12-14, 2004, Location: Funchal, PORTUGAL, Patrocinadores: IEEE Comp Soc, Test Technol Tech Council
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Publication Identifiers
SCOPUS: 2-s2.0-23944526350
Wos: WOS:000230649300003
Source Identifiers
ISSN: 0923-8174
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